Investigation of Electrical Properties and Structure of Vacuum Evaporated C₆₀ Films

Author

Angiras D. Pandya

Date of Award

12-2003

Degree Name

Master of Science

Department

Engineering Design, Manufacturing and Management Systems

First Advisor

Dr. Ahlpitiya Jayatissa

Second Advisor

Dr. Tarun Gupta

Third Advisor

Dr. Valery Bluznuik

Access Setting

Masters Thesis-Open Access

Abstract

C₆₀ is an important electronic material and its properties can be tuned by thermal annealing process and solid phase crystallization process. These properties were investigated as a function of thermal annealing temperature and solid phase crystallization. However there is no systematical study on annealing effect and Solid Phase Crystallization of C₆₀ films. In this study, the effect of thermal annealing on formation of nanocrystalline C₆₀ thin films were investigated for annealed samples and solid phase crystallized samples. The C₆₀ films described here were prepared by vacuum thermal evaporation method. The structural properties of C₆₀ films were investigated with Raman spectroscopy. The electrical properties of C₆₀ films were investigated with current-voltage characteristics and electrical conductivity -temperature measurements. The result indicated that the thermal annealing and solid phase crystallization process bring structural changes in the C₆₀ films and that resulted in change in electrical properties. The performance of the electrical properties was varied because of the transfer of the structural properties by thermal annealing and solid phase crystallization.

Recommended Citation

Pandya, Angiras D., "Investigation of Electrical Properties and Structure of Vacuum Evaporated C₆₀ Films" (2003). Masters Theses. 4333.
https://scholarworks.wmich.edu/masters_theses/4333