Date of Award
4-1991
Degree Name
Master of Science
Department
Electrical and Computer Engineering
First Advisor
Dr. E. Abuelyaman
Second Advisor
Dr. H. Mousavinezhad
Third Advisor
Dr. D. Johnson
Access Setting
Masters Thesis-Open Access
Abstract
The most commonly used model for fault analysis is called the "Stuck-At" model. With this model, a faulty gate input and/or output is modeled as Stuck-at-0 (s--a-0) or Stuck-at-1 (s-a-1). After a certain number of test vectors are applied to a network, the percentage fault coverage is computed. This computed value relates to the percentage of stuck-at faults detectable at the output. Various studies have been made to enhance the performance of fault simulators. In this paper, a modified parallel simulator MODPAR for combinational circuits is presented. A comparison of simulation results from MODPAR is made with that of SCIRTSS (Hill & Huey, 1977), which employs a parallel simulation algorithm. Simulation data indicate that MODPAR enjoys simulation time advantage.
Recommended Citation
Li, Shih-Ming, "A Modified Parallel Fault Simulator for Combinational Circuits" (1991). Masters Theses. 987.
https://scholarworks.wmich.edu/masters_theses/987